Our Industrial Associates Program encourages greater interaction between industrial and academic scientists by providing industrial clients with open access to all of the center’s facilities at rates commensurate with similar services offered by private sector analytical labs. We offer access to advanced instrumentation, technical expertise, training, educational workshops and research collaboration opportunities.
Whether your interests are in new product development or defect analysis, understanding nanostructures and their relationship to performance are critical.
Companies making extensive use of center facilities are encouraged to take advantage of our memberships, which facilitate equipment access, reduce administrative overhead and often result in cost savings. Members who are trained on our instruments can obtain direct access to our characterization laboratories for additional cost savings and greater operating flexibility.
IAP membership benefits
Access to world-class instruments and techniques for materials characterization
Access to staff with expertise in characterization and imaging
Personalized training in the use of advanced instrumentation
Opportunities to engage in research collaboration with ASU
Memberships that streamline access to our labs and reduce administrative overhead
Description: Wide selection of equipment designed to prepare biological samples for electron microscopy imaging. Balzers Critical Point Dryer Critical-point drying is most commonly used with biological…
Description: Ellipsometry is a very sensitive surface and thin film measuring technique using polarized light to determine optical properties and thickness. Measurement parameters can be customized…
Description: FT-IR is a technique used to identify and analyze materials based on inter-atomic and lattice vibrations. Capabilities – Bench Built in Diamond ATR with 60lbs…
Description: FT-IR is a technique used to identify and analyze materials based on inter-atomic and lattice vibrations. Capabilities Full spectral range coverage from ~400 – 8000…
Description: The Eyring Materials Center offers a wide range of furnaces covering temperatures up to 2300°C and sample sizes larger than 4″. Controlled atmospheres are also…
Description: The facility includes a wide range of general lab tools for your use. Tools include: Glove boxes Fume hoods Vacuum line (including glass ampule sealing…
Description: The Big Blue multi-anvil is for higher pressure experiments, reaching a force of 1000 tons. Research on Big Blue usually focuses on the force range…
Description: Optical profilometry uses white light interferometry to generate a 3D image of the sample surface with a height resolution better than 1Å. Uses Film thickness…
Description: A diamond tip stylus is in contact with the sample surface. The sample and sample stage are moved laterally as the tip translates vertically to…
Raman Spectrometer (custom built multi-wavelengths)
Description: The Micro-Raman Spectrometer uses a fingerprint technique to identify materials based on vibrations. Its sensitivity can give information on composition and strain. Capabilities 4 lasers:…
Description: Residual Gas Analysis (RGA) measures the partial pressures of the individual gases in a mixture. RGA is a stand-alone vacuum system that is differentially pumped…
Description: Scanning Probe Microscopy is a family of techniques that extract information about sample properties from the interaction between a probe and a sample surface. Scanning…
Description: What is electron microprobe analysis? Electron microprobe analysis is the quantitative detection of the electron-bombardment-induced emission of characteristic X-rays. This allows for the rapid, nondestructive…
Description: The Thermo ScientificTM CleanMillTM broad ion beam system is used to polish SEM samples with minimal damage for optimal surfaces for EBSD, EDS and WDS….
Description: Specifications Thermal emission SEM with tetrode dual-anode source emission geometry accelerating voltage: 200V to 30kV beam current up to 2µA continuously adjustable Magnification 5 to…
Description: The Zeiss Auriga brings top-of-the-line capabilities and flexibility to researchers and developers combining high-resolution field emission scanning electron microscopy (SEM) and precision focused ion beam…
SEM/FIB Focused Ion Beam – Helios 5 UX (ThermoScientific)
Description: The Helios 5UX (Installation completed June 2020) brings cutting edge capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex structures…
Techniques: Focused ion beam and sample preparation
Description: The Nova NanoLab is a ultra-high resolution field emission scanning electron microscopy (SEM). Electron Optics High-resolution Field Emission-SEM column, with monopole magnetic immersion final lens,…
Techniques: Focused ion beam and sample preparation
Description: The ARM200F is an aberration corrected STEM equipped with both an x-ray spectrometer and a special, newly developed electron spectrometer, with ultra-fast EELS that allows…
Description: The Nion UltraSTEM 100 is an aberration corrected STEM that offers sub-angstrom resolution at both 100 keV and 60 keV. The Nion can also run…
Techniques: Aberration corrected TEM/STEM, 4D-STEM, Electron Energy Loss Spectroscopy
Description: The Talos L120C G2 is a TEM only instrument with a LaB6 emitter. Specifications: 0.2 nm TEM line resolution 0.37 nm TEM point resolution Automatic…
Techniques: TEM, Life Science Electron Microscopy.
Description: The FEI Titan ETEM is an aberration-corrected, monochromated, environmental TEM ideally suited for observing functional materials at the atomic level. It features a unique differentially-pumped…
Description: ASU’s Titan Krios is a dedicated cryogenic transmission electron microscope for soft matter and organic assemblies such as those found in cellular life and other…
Description: LABSYS EVO from Setaram. TGA/DTA/DSC/Cp RT to 1500°C TGA/DTA and DSC measure temperature-related material properties such as mass loss, melting points, and other phase transitions….
Description: The Lambda 950 UV/Vis/NIR is a double beam, double monochromator, all-reflecting optical system which operates in the ultraviolet (UV), visible (vis) and near infra-red (NIR)…
Description: The SigRay QuantumLeap H2000 X-ray absorption spectrometer offers a laboratory version of a widely used synchrotron technique. Features 300W Mo X-ray source. 4.5 keV to…
X-ray Diffractometer – High Resolution – Rigaku SmartLab
Description: Sample types: Epitaxial thin films Polycristalline thin films powders Maximum wafer size: 6″ Measurements: Rocking curves and omega/2theta measurement of epitaxial films Crystal orientation/offcut Stresses/strain…
Description: The Malvern PANalytical Aeris research edition powder diffractometer provides fast, reliable and accurate materials analysis solutions for your powder diffraction needs. operates at 600W (15mA…
X-ray Diffractometer – STOE STADI P Dual Transmission
Description: The STOE STADI P dual diffractometer is a transmission X-ray diffractometer using monochromated Kα1 radiation. On the left side of the instrument, the system is…
X-ray Fluorescence Spectrometer – Energy Dispersive (Bruker S2 PUMA)
Description: X-Ray Fluorescence Spectroscopy (XRF) is a technique used to determine chemical composition by exciting sample material through bombardment with x-rays. The Bruker S2 PUMA is…
X-ray Photoelectron Spectroscopy (Kratos Axis Supra +)
Description: XPS provides elemental composition and chemical bonding information on the sample’s first few atomic layers. XPS is also referred to as Electron Spectroscopy for Chemical…
Description: XRT is a non-destructive diffraction method used to map lattice defects and strain in single crystals on the millimeter to micrometer scale. Applications Map defects…