Description
A diamond tip stylus is in contact with the sample surface. The sample and sample stage are moved laterally as the tip translates vertically to measure vertical variations from <1 nm to 1 mm.
The lateral data resolution is dependent on probe size ( tip radius), scan duration, scan length, and the force applied.
- Max Scan length 55 mm
- 12.5 μm tip radius
- 0.03-15 mg variable stylus force
- Vertical repeatability = 4Å on 0.1 um step.
- Vertical range: 1 mm
- Max sample thickness: 50 mm / max sample diameter: 8″
Limitations
- Profilometry tip touches the sample
- Sample may be damaged by profilometry
- Single line scan
Contact
Anthony Woolson
Research Specialist
[email protected]
480-727-2670
Emmanuel Soignard
Operations Director
[email protected]
480.965.7242
Techniques
- Surface imaging
Rates
| Service or material | ASU rate | Nonprofit or academic rate | Notes |
|---|---|---|---|
| Equipment use | $31.00/hr | $65.00/hr | |
| Equipment use with staff assistance | $91.00/hr | $161.00/hr |
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