Description
The Thermo ScientificTM CleanMillTM broad ion beam system is used to polish SEM samples with minimal damage for optimal surfaces for EBSD, EDS and WDS. It also offers the ability to keep the sample in vacuum while transporting it in to the Prisma E SEM to avoid any air exposure between polishing and SEM imaging.
Ion optics
- 0.1-16kV
- 10-500 µA
- maximum sputter rate >500 µm/hr
Sample holder
- Standard surface polishign holder: 30mm diameter x 15mm height sample maximum
- Clean connect holder: 28mm diameter x 3mm
- Cross section polishing: 90° slope: 10mmx10mmx3mm
- sample tilt 0-180° in 0.1° steps
- sample rotation 360° in plane rotation
- sample oscillation +/- 1° to +/- 180° in 1° steps
Contact
Ken Mossman
Research Specialist
[email protected]
480.965.0946
Techniques
- SEM preparation
- sample polishing
Rates
| Service or material | ASU rate | Nonprofit or academic rate | Notes |
|---|---|---|---|
| Equipment use | $40.00/hr | $91.00/hr | |
| Equipment use with staff assistance | $100.00/hr | $196.00/hr |
