Description
Specifications
- Source: High brightness X-FEG
- Imaging Modes: TEM/STEM
- Accel. Voltage: 80, 120 and 200KV
- STEM resolution: <0.14nm
- TEM line resolution < 0.10 nm
Detectors
- Segmented Panther STEM detector
- Dual Bruker XFlash 6 EDX Detectors 100mm2 each with 129eV resolution
- Speed-enhanced Ceta-S Camera (4kx4k 40fps / 512×512 320pfs)
- Medipix Merlin EM camera for 4D STEM measurements
Ancillary Equipment
- Double-Tilt Holder
- Single tilt LN2 holder
- Single tilt Tantalum furnace holder (max temperature 1300°C)
- Lorentz Lens
- Biprism
Helpful external videos
- https://youtu.be/47udiOKXO8s
- https://youtu.be/00HZOARGTYA
- https://youtu.be/7LwJLAZqHmk
- https://youtu.be/qK6Jj6imT7s
Contact
Piyush Haluai
Engineer
[email protected]
602-496-0521
Manuel Roldan Gutierrez
Associate Research Scientist
[email protected]
480-965-0946
Techniques
- TEM/STEM
Documents and manuals
Rates
| Service or material | ASU rate | Nonprofit or academic rate | Notes |
|---|---|---|---|
| Equipment use | $76.00/hr | $137.00/hr | |
| Equipment use with staff assistance | $136.00/h | $242.00/hr |
