TEM/STEM 2010F (JEOL)

Description

The 2010 F is equipped with thin-window light-element-sensitive X-ray detector and a Gatan Enfina energy-loss spectrometer for high spatial resolution microanalysis. The microscope can be operated in annular dark-field STEM mode and can achieve resolution 0.14 nm.

Specifications
•    Imaging Modes: TEM/STEM
•    Accel. Voltage: 200KV
•    Cs: 0.5mm
•    PTP Resolution: 0.19nm
•    Focused Probe: 0.2nm
•    Source: Schottky Field Emission
•    Tilt Range: ± 15°

Ancillary Equipment
•    CCD Camera
•    Enfina PEELS Detector
•    X-Ray Detector
•    Double-Tilt Holder
•    Gatan and EDAX Acquisition System

Contact 

Karl Weiss
Research Professional Sr
Karl.Weiss@asu.edu
480.965.3831

 

Techniques
  • TEM/STEM
ASU Unit
Knowledge Enterprise
Rates
Cost for ASU Internal Cost for ASU Internal with Staff Assistance Cost for Other Academic/Non-Profit Cost for Other Academic/Non-Profit with Staff Assistance
$48/h
$86/h
$115/h
$198/h
We welcome industry customers! Contact us to find out our current rates.
Photos
2010F (JEOL)