Description
The 2010 F is equipped with thin-window light-element-sensitive X-ray detector and a Gatan Enfina energy-loss spectrometer for high spatial resolution microanalysis. The microscope can be operated in annular dark-field STEM mode and can achieve resolution 0.14 nm.
Specifications
• Imaging Modes: TEM/STEM
• Accel. Voltage: 200KV
• Cs: 0.5mm
• PTP Resolution: 0.19nm
• Focused Probe: 0.2nm
• Source: Schottky Field Emission
• Tilt Range: ± 15°
Ancillary Equipment
• CCD Camera
• Enfina PEELS Detector
• Double-Tilt Holder
Contact
Karl Weiss
Research Professional Sr
Karl.Weiss@asu.edu
480.965.3831
Techniques
- TEM/STEM
Documents and manuals
- File
- File
- File
- File
- Filenanodiffraction.pdf288.32 KB
- Filereflection_electron_microscopy.pdf286.11 KB
ASU Unit
Knowledge Enterprise
Rates
| Cost for ASU Internal | Cost for ASU Internal with Staff Assistance | Cost for Other Academic/Non-Profit | Cost for Other Academic/Non-Profit with Staff Assistance |
|---|---|---|---|
|
$50/h
|
$89/h
|
$118/h
|
$206/h
|
Photos
