Description
The Maury MT2000 active load-pull ystem integrated with a FormFactor Summit 200 probe station provides advanced on-wafer RF and microwave device characterization for research, development and technology validation.
The MT2000 supports active and hybrid active load-pull measurements with programmable impedance synthesis, allowing evaluation of output power, gain, efficiency, linearity, harmonic performance, ACPR, EVM and device ruggedness.
The FormFactor Summit 200 provides a stable, EMI-shielded measurement environment with wafer probing and thermal characterization capabilities from -60°C to 300°C.
Typical Measurements
- Output power (Pout)
- Power-added efficiency (PAE)
- Gain and gain compression
- Harmonic impedance tuning
- ACPR and EVM characterization
Applications
- RF power amplifier development
- 5G and wireless communications research
- GaN and GaAs device characterization
- MMIC development and validation
- Semiconductor process development
Techniques
- Active load-pull characterization
- Hybrid active load-pull measurements
- Source-pull and load-pull analysis
- RF power amplifier characterization
- Harmonic load-pull measurements
- Pulsed RF measurements
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