Semiconductor Device Processing

Solar Fab

12. KLA-Tencor P-17 OF Profiler

Description

The KLA-Tencor P-17 OF Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces.

  • It uses stylus-based scanning to achieve high resolution.
  • It is capable of measuring samples up to 300mm diameter.
  • The P-17 OF has a vertical range of 327 µm.
  • It is capable of scanning at forces between 0.5 and 50 mg.

Techniques

  • Surface Profiling

Video

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