Materials Characterization and Synthesis

Eyring Materials Center

Profilometer – Optical (ZeScope)

Description

Optical profilometry uses white light interferometry to generate a 3D image of the sample surface with a height resolution better than 1Å.

Uses

  • Film thickness from an edge
  • Transparent film thickness in the 1 to 50 μm range with no edge/step
  • Volume of etch pits / hole
  • Roughness
  • Radius of curvature

Useful gauges

  • Non-contact
  • 8″ square area (typically only measure ~ 1×1″ at the very most)
  • 9 computer-controlled magnifications using 3 objectives (5x, 20x, 50x)
  • Maximum vertical range ~7 mm using 5X
  • Maximum sample height: 180 mm
  • Full 3D map
  • Lateral resolution up to ~0.3 μm

Contact

Anthony Woolson
Research Specialist
[email protected]
480-727-2670

Emmanuel Soignard
Operations Director
[email protected]
480.965.7242

Techniques

  • Surface imaging

Documents and manuals

Rates

Service or materialASU rateNonprofit or academic rateNotes
Equipment use$31.00/hr$65.00/hr
Equipment use with staff assistance$91.00/hr$161.00/hr

Video

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