The center has several tools to image surfaces in addition to the electron microscopy techniques. Scanning-probe instruments use a small tip to determine surface topography and other information on the nanometer lateral scale for very flat surfaces. Stylus profilometry scans a multi-micron-size diamond tip across a surface to measure topography. Optical profilometry uses white-light interferometry to generate a 3D picture of a surface in a few seconds.
- Optical Profilometer (ZeScope)
- Stylus Profilometer (Bruker Dektak XT)
- Scanning Probe/ Atomic force Microscopy (SPM/AFM)
- Raman / AFM (Witec Alpha 300 RA+)
- X-ray topography (Rigaku XRT-100)