Scanning Probe/ Atomic force Microscopy (SPM/AFM)

Scanning Probe Microscopy is a family of techniques that extract information about sample properties from the interaction between a probe and a sample surface. Scanning Force Microscopy, specifically, uses the force (or force gradient) between a carefully selected probe and the sample to extract spatially-indexed information about variations in that force across the area(s) sampled.

Bruker MultiMode 8 

A “scan-by-sample” instrument capable of topographic imaging via contact and intermittent contact (a.k.a., “tapping”) modes, imaging of surface charge density by electrostatic force microscopy, imaging of magnetic domains by magnetic force microscopy (MFM), qualitative analysis of surface potential by amplitude modulation Kelvin probe force microscopy (AM-KPFM), spatially indexed electrical conductivity measurements by conductive atomic force microscopy (cAFM), and investigating nanomechanical properties by nanoindentation and Bruker’s proprietary Peak Force Quantitative Nanomechanical Mapping (PeakForce QNM®). Bruker ScanAsyst™ is available for those with compatible probes.

• Standard JVLR scanner has ~ 140 μm lateral (XY) scan range and ~ 5.6 μm vertical (Z) scan range. Other scanners may be available for use; please inquire with staff.
• In acoustic enclosure, image noise (in Z) ~ 50 pm.
• The scanner can accommodate samples that are less than 15 mm in diameter.
• Can be operated in ambient or controlled (nitrogen or argon) atmospheres with custom-modified VAC glovebox.
• Compatible samples can be imaged under liquid in a fluid cell.
• Factory calibrated probes are strongly recommended for PeakForce modes.

Techniques

• Contact and tapping modes
• EFM and MFM
• AM-KPFM
• cAFM
• nanoindentation
• PeakForce QNM®

Bruker Dimension Icon

A “scan-by-probe” instrument capable of topographic imaging via contact and tapping modes, magnetic domains by MFM, surface potential by AM-KPFM and frequency modulation KPFM (FM-KPFM), measuring local changes in dielectric coefficient by scanning capacitance microscopy (SCM), charge carrier profiling by scanning spreading resistance microscopy (SSRM), mapping piezoelectric domains by piezo-response force microscopy (PFM), high-sensitivity, spatially-indexed electrical conductivity measurements by cAFM, and tunneling current AFM (TUNA™), and nanomechanical investigations by PeakForce QNM®. Bruker ScanAsyst™ is available for those with compatible probes.

• Scan head has ~ 90 μm lateral (XY) scan range and ~10 μm vertical (Z) scan range.
• In isolation cabinet, image noise (in Z) ~ 20 pm.
• The sample chuck can accommodate large variety of samples from 8” wafers (with vacuum hold-down) to specimens mounted on traditional magnetic sample discs (5-15 mm diameter).
• All modes in ambient atmosphere only.
• Factory calibrated probes are strongly recommended for PeakForce modes.

Techniques

• Contact and tapping modes
• EFM and MFM
• AM-KPFM, FM-KPFM, PeakForce KPFM
• cAFM, TUNA™, PeakForce TUNA™, and DataCube TUNA™
• PFM
• SCM and DataCube SCM
• SSRM, PeakForce SSRM, DataCube SSRM
• PeakForce QNM®

Sample preparation

• Cryo-ultramicrotome

Qualification and Training

Training by qualified EMC staff is required for independent use of the SPMs in the facility and can be requested on the GMSF iLab landing page. Once trained, the instrument may be reserved on a “first-come, first-served” basis through iLab for use 24 hours a day, 7 days a week. Researchers requiring inert atmosphere or liquid cell measurements must coordinate with responsible staff before scheduling due to additional set-up and training requirements.

Users must attend the ASU Lab Safety and Fire Safety courses.

Contact

Anthony Woolson
Research Specialist
Anthony.woolson@asu.edu
480-727-2670