Profilometer - Stylus (Bruker Dektak XT)

Description

A diamond tip stylus is in contact with the sample surface. The sample and sample stage are moved laterally as the tip translates vertically to measure vertical variations from <1 nm to 1 mm.

The lateral data resolution is dependent on probe size ( tip radius), scan duration, scan length, and the force applied.

  • Max Scan length 55 mm
  • 12.5 μm tip radius
  • 0.03-15 mg variable stylus force
  • Vertical repeatability = 4Å on 0.1 um step.
  • Vertical range: 1 mm
  • Max sample thickness: 50 mm / max sample diameter: 8"

Limitations

  • Profilometry tip touches the sample
  • Sample may be damaged by profilometry
  • Single line scan

Contact

Emmanuel Soignard
Operations Director
Emmanuel.Soignard@asu.edu
480.965.7242

Techniques
  • Surface imaging
ASU Unit
Knowledge Enterprise
Rates
Cost for ASU Internal Cost for ASU Internal with Staff Assistance Cost for Other Academic/Non-Profit Cost for Other Academic/Non-Profit with Staff Assistance
$28.10/h
$69.10/h
$62.40/h
$154.40/h
Photos
Stylus Profilometer (Bruker Dektak XT)
Videos