| Bio EM Sample prep |
Sample preparation |
| Ellipsometer (M2000) |
Optical spectroscopy |
| FT-IR (PerkinElmer Frontier FTIR) |
Optical spectroscopy |
| Furnaces |
Materials processing and calorimetry |
| General Lab |
Materials processing and calorimetry |
| Ion Beam Analysis of Materials (IBeAM) |
Ion beam analysis of materials |
| Multi-Anvil Press |
High-pressure synthesis |
| Profilometer - Optical (ZeScope) |
Surface imaging |
| Profilometer - Stylus (Bruker Dektak XT) |
Surface imaging |
| Raman / AFM (Witec Alpha 300 RA+) |
Optical spectroscopy, Surface imaging |
| Raman Spectrometer (custom built multi-wavelengths) |
Optical spectroscopy |
| Residual Gas Analysis (SRS200) |
Materials processing and calorimetry |
| Scanning Probe/ Atomic force Microscopy (SPM/AFM) |
Surface imaging |
| SEM Electron Microprobe Analyzer |
SEM, Quantitative X-ray analysis |
| SEM prep - CleanMill Broad Ion System |
SEM preparation, sample polishing |
| SEM Prisma E SEM |
SEM, ESEM, EDS |
| SEM/FIB Focused Ion Beam - Helios 5 UX (ThermoScientific) |
Focused ion beam and sample preparation |
| SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI) |
Focused ion beam and sample preparation |
| SEM/FIB Focussed Ion Beam - Auriga (Zeiss) |
SEM, FIB, EBSD, EDS |
| Small Angle X-ray Scattering - SAXS Xenocs Xeuss 3.0 |
SAXS, X-ray diffraction, SAXS/WAXS, Sample Temperature Control, Simultaneous Tensile/Scattering, Radiographic Image Mapping, Biosolution Scattering with pipeting Robot |
| TEM/STEM ARM200F (JEOL) |
Aberration corrected TEM/STEM |
| TEM/STEM Nion Monochromate UltraSTEM 100 |
Aberration corrected TEM/STEM, 4D-STEM, Electron Energy Loss Spectroscopy |
| TEM/STEM Talos F200i |
TEM/STEM |
| TEM/STEM Talos L120C (TFS) |
TEM, Life Science Electron Microscopy. |
| TEM/STEM Titan 300/80 (FEI) |
Aberration corrected TEM/STEM |
| TEM/STEM Titan Krios (FEI) |
TEM/STEM |
| Thermal Analysis (TGA/DTA/DSC) |
Materials processing and calorimetry |
| UV-Vis Spectrometers (Perkin Lambda 950) |
Optical spectroscopy |
| X-ray absorption spectroscopy - SigRay QuantumLeap H2000 |
XAS, EXAFS, X-ray absorption spectroscopy |
| X-ray Diffractometer - High Resolution - Rigaku SmartLab |
X-ray diffraction |
| X-ray Diffractometer - Powder (Malvern PANalytical Aeris) |
X-ray diffraction |
| X-ray Diffractometer - STOE STADI P Dual Transmission |
X-ray diffraction |
| X-ray Fluorescence Spectrometer -Energy Dispersive (Bruker S2 PUMA) |
X-ray fluorescence |
| X-ray Photoelectron Spectroscopy (Kratos Axis Supra +) |
Surface composition |
| X-ray Topography (Rigaku XRT-100) |
X-ray diffraction |
