Equipment

Equipment Techniques
Bio EM Sample prep Sample preparation
Ellipsometer (M2000) Optical spectroscopy
FT-IR / FT-Raman (Bruker IFS66V/S and PerkinElmer Frontier FTIR) Optical spectroscopy
Furnaces Materials processing and calorimetry
General Lab Materials processing and calorimetry
Ion Beam Analysis of Materials (IBeAM) Ion beam analysis of materials
Multi-Anvil Press High-pressure synthesis
Piston Cylinder High-pressure synthesis
Profilometer - Optical (ZeScope) Surface imaging
Profilometer - Stylus (Bruker Dektak XT) Surface imaging
Raman / AFM (Witec Alpha 300 RA+) Optical spectroscopy, Surface imaging
Raman Spectrometer (custom built multi-wavelengths) Optical spectroscopy
Residual Gas Analysis (SRS200) Materials processing and calorimetry
Scanning Probe/ Atomic force Microscopy (SPM/AFM) Surface imaging
SEM Electron Microprobe Analyzer SEM, Quantitative X-ray analysis
SEM SNE-4500M Table Top SEM
SEM/FIB Focused Ion Beam - Helios 5 UX (ThermoScientific) Focused ion beam and sample preparation
SEM/FIB Focused Ion Beam - Nova 200 NanoLab (FEI) Focused ion beam and sample preparation
SEM/FIB Focussed Ion Beam - Auriga (Zeiss) SEM, FIB
TEM/STEM 2010F (JEOL) TEM/STEM
TEM/STEM ARM200F (JEOL) Aberration corrected TEM/STEM
TEM/STEM CM200-FEG (Philips) TEM/STEM
TEM/STEM Nion Monochromate UltraSTEM 100 Aberration corrected TEM/STEM, 4D-STEM, Electron Energy Loss Spectroscopy
TEM/STEM Philips CM 12 TEM (Bio) TEM/STEM
TEM/STEM Titan 300/80 (FEI) Aberration corrected TEM/STEM
TEM/STEM Titan Krios (FEI) TEM/STEM
Thermal Analysis (TGA/DTA/DSC) Materials processing and calorimetry
UV-Vis Spectrometers (Perkin Lambda 950) Optical spectroscopy
X-ray Diffractometer - High Resolution (PANalytical X'Pert PRO MRD) X-ray diffraction
X-ray Diffractometer - Powder (Malvern PANalytical Aeris) X-ray diffraction
X-ray Fluorescence Spectrometer -Energy Dispersive (Bruker S2 PUMA) X-ray fluorescence
X-ray Photoelectron Spectroscopy (Krator Axis Supra +) Surface composition
X-ray Topography (Rigaku XRT-100) X-ray diffraction