TEM/STEM Talos F200i

Description

 

Specifications

  • Source: High brightness X-FEG
  • Imaging Modes: TEM/STEM
  • Accel. Voltage: 80, 120 and 200KV
  • STEM resolution: <0.14nm
  • TEM line resolution < 0.10 nm

Detectors

  • Segmented Panther STEM detector
  • Dual Bruker XFlash 6 EDX Detectors 100mm2 each with 129eV resolution
  • Speed-enhanced Ceta-S Camera (4kx4k 40fps / 512x512 320pfs)
  • Medipix Merlin EM camera for 4D STEM measurements

Ancillary Equipment

  • Double-Tilt Holder
  • Single tilt LN2 holder
  • Single tilt Tantalum furnace holder (max temperature 1300°C)
  • Lorentz Lens
  • Biprism

Contact

Peng Zuo
Engineer
peng.zuo@asu.edu
480-965-9806
 
Piyush Haluai
Engineer
phaluai@asu.edu
602-496-0521
 
Manuel Roldan Gutierrez
Associate Research Scientist
manuel.roldan-gutierrez@asu.edu
480-965-0946
Techniques
  • TEM/STEM
ASU Unit
Knowledge Enterprise
Rates
Cost for ASU Internal Cost for ASU Internal with Staff Assistance Cost for Other Academic/Non-Profit Cost for Other Academic/Non-Profit with Staff Assistance
$70/h
$111/h
$126.30/h
$218.30/h