Description
Specifications
- Source: High brightness X-FEG
- Imaging Modes: TEM/STEM
- Accel. Voltage: 80, 120 and 200KV
- STEM resolution: <0.14nm
- TEM line resolution < 0.10 nm
Detectors
- Segmented Panther STEM detector
- Dual Bruker XFlash 6 EDX Detectors 100mm2 each with 129eV resolution
- Speed-enhanced Ceta-S Camera (4kx4k 40fps / 512x512 320pfs)
- Medipix Merlin EM camera for 4D STEM measurements
Ancillary Equipment
- Double-Tilt Holder
- Single tilt LN2 holder
- Single tilt Tantalum furnace holder (max temperature 1300°C)
- Lorentz Lens
- Biprism
Helpful external videos
- https://youtu.be/47udiOKXO8s
- https://youtu.be/00HZOARGTYA
- https://youtu.be/7LwJLAZqHmk
- https://youtu.be/qK6Jj6imT7s
Contact
Techniques
- TEM/STEM
Documents and manuals
- Fileelectron_holography.pdf70.05 KB
- File
- File
- File
- Filenanodiffraction.pdf288.32 KB
- Filereflection_electron_microscopy.pdf286.11 KB
- Filelorentz_imaging.pdf62.12 KB
ASU Unit
Knowledge Enterprise
Rates
| Cost for ASU Internal | Cost for ASU Internal with Staff Assistance | Cost for Other Academic/Non-Profit | Cost for Other Academic/Non-Profit with Staff Assistance |
|---|---|---|---|
|
$70/h
|
$111/h
|
$126.30/h
|
$218.30/h
|