Description
The Philips CM200-FEG high resolution TEM/STEM can be used for high resolution imaging and spectroscopy, Lorentz imaging of magnetic materials at nanometer resolutions, and electron holography of electric and magnetic fields.
Specifications
- Imaging Modes: TEM/STEM
- Accel. Voltage: 200KV
- Cs: 1.2mm
- PTP Resolution: 0.25nm
- Focused Probe: 0.5nm
- Source: Schottky Field Emission
- Tilt Range: ± 25°
Ancillary Equipment
- CCD Camera
- PEELS Detector
- X-Ray Detector
- Double-Tilt Holder
- Lorentz Lens
- Electrostatic Biprism
- ES VisionTM Acquisition System
Contact
Karl Weiss
Research Professional Sr
Karl.Weiss@asu.edu
480.965.3831
Techniques
- TEM/STEM
Documents and manuals
- File
- Fileelectron_holography.pdf70.05 KB
- File
- File
- File
- File
- Filenanodiffraction.pdf288.32 KB
- Filereflection_electron_microscopy.pdf286.11 KB
- Filelorentz_imaging.pdf62.12 KB
ASU Unit
Knowledge Enterprise
Rates
| Cost for ASU Internal | Cost for ASU Internal with Staff Assistance | Cost for Other Academic/Non-Profit | Cost for Other Academic/Non-Profit with Staff Assistance |
|---|---|---|---|
|
decommissioned
|
decommissioned
|
decommissioned
|
decommissioned
|
Photos
