BIF - Nikon SIM-E Structured illumination microscope

This three laser (488, 561, 640 nm) super-resolution microscope provides ~110 nm lateral resolution in the green, red, and far-red emission ranges. It includes a fully automated, inverted Ti2-E microscope base, motorized encoded stage with repeat position accuracy of ≤ 0.5 µm, Perfect Focus System, and ORCA-Flash 4.0 V2 Digital CMOS camera.