Description
Silicon solar cell efficiency is critically dependent upon the minority carrier lifetime. The Sinton WCT-120 offline wafer lifetime tool can measure lifetimes of wafers in the range of 10 ns to 10 ms using either transient photoconductance decay (for high lifetime samples) or Sinton’s own quasi-steady-state photoconductance (QSSPC) method. A particularly attractive aspect of the system is the ability to produce calibrated lifetime measurements so that the cell voltage can be predicted even before contacts are applied. In may cases the efficiency of the solar cell and parameters such as fill factor (FF) can be predicted early on in the process even without electrical contacts.
Location: MTW - MacroTechnology Works, cleanroom 2213A
Techniques
- Lifetime measurement of passivated substrates
ASU Unit
Knowledge Enterprise
