Woollam Ellipsometer M2000

The M-2000 is most commonly used to measure thin film thickness and optical constants. It is sensitive to less than a monolayer of material (sub-nm) on a surface and yet can determine thickness for transparent films up to tens of microns. The M-2000 can also measure the optical constants (both n and k) from any type of material, whether dielectric, organic, semiconductor, or metal. In addition to optical constants, there are additional material properties that can be indirectly determined based on how they affect changes to a material’s optical response.

The M-2000 can be measured from small size like 1-inch square up to Gen-II (370 mm X 470 mm) size.