The Keysight PD1500A dynamic power device analyzer utilizes the Double Pulse Test (DPT) technique to characterize wide bandgap semiconductors. Some characteristics of the instrument include:
- Characterize 600 V, 1.2 kV, and 1.7 kV rated discrete devices.
- ID/IC up to 200 A.
- Fast slew rate, high bandwidth measurement probes.
- Electrical I-V characterization for wide-bandgap semiconductor devices
Documents and manuals
- File1.29 MB
- File1.05 MB
|Service||ASU rate||Nonprofit/other academic rate||Notes|