X-ray diffraction is typically used for phase identification and composition, crystal structure, crystal quality, orientation, strain state, crystal chemistry and defect density, surface quality, film thickness and sample texture. The typical samples are thin films (both single crystal and polycrystalline) as well as powders.
- High Resolution X-ray diffractometer - Rigaku SmartLab
- Powder X-ray Diffractometer - Aeris (PANalytical)
- Transmission X-ray diffractometer (STOE)
- Xeuss 3.0 SAXS/WAXS (Xenocs)
- X-ray topography (Rigaku XRT-100)
